New GE industrial-scale process control system with computed tomography
The scatter/correct technology developed by GE Measurement & Control is now exclusively available for industrial microCT users of GE’s phoenix v|tome|x m CT system. It provides significant CT data quality improvements for high-energy microfocus CT scans with up to 300 kV. The scatter/correct technology enhances defect detection and analysis as well as 3D metrology for automotive, aerospace, and power generation parts, and can be applied to “high scattering materials,” such as steel, aluminum, composites, and multi-material samples.
GE’s proprietary scatter/correct technology is a combination of hardware and software now available for the v|tome|x m system. This technology automatically removes scatter artifacts from the CT volume, allowing users to gain a low-scatter artifact quality level never before reached with conventional cone beam microCT.
Process control productivity on the production floor is increased by clearly improved quantitative volume evaluations, such as automatic defect recognition (ADR) or more precise 3D metrology results.
“GE’s breakthrough scatter/correct innovation really changes the limitations of industrial CT. Until now, CT manufacturers had to increase the X-ray energies to minimize the negative scatter radiation quality impact,” stated Dr. Oliver Brunke, senior CT product manager at GE Measurement & Control. “But this led to more complex, heavier shielded and expensive systems. With scatter/correct, CT users can now perform in many cases scans normally requiring a 450 kV X-ray tube with a 300 kV X-ray tube by using the available tube spectrum much more effectively.”
The phoenix v|tome|x m is a versatile X-ray microfocus CT system with optional high-resolution nanoCT® capability for 3D metrology and failure analysis with up to 300 kV / 500 W. Beyond down to < 1 µm detail detectability, the system offers industry leading magnification and power at 300 kV.
GE’s “click-and-measure, CT acquisition, reconstruction and evaluation automation functionality” makes it an efficient and reproducible 3D evaluation tool. The phoenix v|tome|x m system also is available as a metrology edition for precise and reproducible 3D metrology. The optional, dual-tube configuration enables high-resolution nanoCT® of low absorbing samples.
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