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Benchtop WD-XRF Spectrometer System

June 29, 2008
First commercial high-power system
RIGAKU'S Supermini high-power benchtop wavelength dispersive x-ray fluorescence (WD-XRF) spectrometer system delivers rapid, high-sensitivity, non-destructive analysis of elements from fluorine through uranium in solids, liquids, powders, and thin films. It affords precision analysis at the low concentration levels common to today's applications. Employs three analyzing crystals, two detectors, a 12-position sample changer, and a choice of analysis in an air, vacuum, or helium atmosphere.